TY - GEN

T1 - Micro-scanning error correction technique for an optical micro-scanning thermal microscope imaging system

AU - Gao, Mei Jing

AU - Tan, Ai Ling

AU - Yang, Ming

AU - Xu, Jie

AU - Zu, Zhen Long

AU - Wang, Jing Yuan

N1 - Publisher Copyright: © 2018 SPIE.

PY - 2018

Y1 - 2018

N2 - With optical micro-scanning technology, the spatial resolution of the thermal microscope imaging system can be increased without reducing the size of the de-Tector unit or increasing the detector dimensions. Due to optical micro-scanning error, the four low-resolution images collected by micro-scanning thermal micro- scope imaging system are not standard down-sampled images. The reconstruct- ed image quality is degraded by the direct image interpolation with error, which inuences the performance of the system. Therefore, the technique to reduce the system micro-scanning error need to be studied. Based on micro-scanning technology and combined with new edge directed interpolation(NEDI) algorithm, an error correction technique for the micro-scanning instrument is proposed. Simulations and experiments show that the proposed technique can reduce the optical micro-scanning error, improve the imaging effect of the system and improve the systems spatial resolution. It can be applied to other electro-optical imaging systems to improve their resolution.

AB - With optical micro-scanning technology, the spatial resolution of the thermal microscope imaging system can be increased without reducing the size of the de-Tector unit or increasing the detector dimensions. Due to optical micro-scanning error, the four low-resolution images collected by micro-scanning thermal micro- scope imaging system are not standard down-sampled images. The reconstruct- ed image quality is degraded by the direct image interpolation with error, which inuences the performance of the system. Therefore, the technique to reduce the system micro-scanning error need to be studied. Based on micro-scanning technology and combined with new edge directed interpolation(NEDI) algorithm, an error correction technique for the micro-scanning instrument is proposed. Simulations and experiments show that the proposed technique can reduce the optical micro-scanning error, improve the imaging effect of the system and improve the systems spatial resolution. It can be applied to other electro-optical imaging systems to improve their resolution.

KW - Micro-scanning error correction

KW - New edge directed interpolation(nedi)

KW - Optical micro-scanning

KW - Spatial resolution

KW - Thermal microscope imaging system

UR - http://www.scopus.com/inward/record.url?scp=85040982701&partnerID=8YFLogxK

U2 - 10.1117/12.2282762

DO - 10.1117/12.2282762

M3 - Conference contribution

AN - SCOPUS:85040982701

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - 2017 International Conference on Optical Instruments and Technology

A2 - Situ, Guohai

A2 - Osten, Wolfgang

A2 - Cao, Xun

PB - SPIE

T2 - 2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, OIT 2017

Y2 - 28 October 2017 through 30 October 2017

ER -